Water for Wafers: Groundwater Extraction at a Semiconductor Plant Leads to a Decade of Surface Deflation Observed with Multi-Track InSAR

Hurewitz, Zel

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Abstract: Water for Wafers: Groundwater Extraction at a Semiconductor Plant Leads to a Decade of Surface Deflation Observed with Multi-Track InSAR (AGU25)

Water for Wafers: Groundwater Extraction at a Semiconductor Plant Leads to a Decade of Surface Deflation Observed with Multi-Track InSAR

Zel Hurewitz¹, Adrian A Borsa¹ and Tonie M van Dam², (1)Scripps Institution of Oceanography, University of California San Diego, La Jolla, United States, (2)University of Utah, Department of Geology and Geophysics, Salt Lake City, United States