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Abstract: Optical emission sensitivity to model variability: a microphysics deep dive on light from lightning. (AGU25)

Optical emission sensitivity to model variability: a microphysics deep dive on light from lightning.

Dr. Kelcy N Brunner1, Jeffrey C Burchfield2, Eric C Bruning1 and Patrick N Gatlin3, (1)Texas Tech University, Lubbock, TX, United States, (2)University of Alabama in Huntsville, Earth System Science Center, Huntsville, AL, United States, (3)NASA Marshall Space Flight Center, Huntsville, AL, United States
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