Combining fs LA-ICP-MS, FIB and STXM-NEXAFS Methods for in-situ High-Spatial-Resolution Rock Varnish Analyses at the nm to µm Scale
Abstract:
We used a combination of 200 nm-femtosecond LA-ICP-MS, focused ion beam (FIB) slicing and scanning transmission X-ray microscopy – near edge X-ray absorption fine structure spectroscopy (STXM-NEXAFS) for the high-spatial-resolution analysis of rock varnish from different locations (Negev, Israel; Knersvlakte, South Africa; Death Valley and Mojave Desert, California). Femtosecond LA-ICP-MS was used for the quantitative determination of major and trace element concentrations. In-situ measurements were conducted on thick sections with the advantages of non-matrix matched calibration, low ablation depth of ~10 µm for laser spot sizes of 10-40 µm and low detection limits of trace elements (< 0.01 – 1 µg g-1). Our results demonstrate that elements, such as Mn, Co, Pb, Ni and Cu, are highly enriched in varnish relative to the upper continental crust (up to a factor of 1000). Differences between varnishes from the various locations can be observed especially for the Mn/Fe (0.4-25.6), Mn/Ba (3-363) and Ni/Co (0.03-1.8) ratios. The REE patterns differ with LaN/YbN = 2-14 and positive Ce anomalies (Ce/Ce* = 1.1 – 9.1).
To study the internal structures of varnish, 100 – 200 nm thick FIB slices were prepared to perform mappings of Fe, Mn, O, N, CO3, K, Ca, and C at the nm scale. In addition, the oxidation stages of Mn and Fe were identified. Banded internal structures of Mn and organic C can be observed in some samples, and cavities that are partly filled by C and Mn rich material. Some coatings tend to incorporate bigger dust grains (> 1 µm), while others only show very fine grained material (< 0.1 µm). The results of the combined microanalytical techniques give us detailed insights that can be a further step to unravel the genesis of rock varnish.
