Abstract: Improved Modeling of Surface Layer Parameters in a AGCM Using Refined Vertical Resolution in the Surface Layer (2017 AGU Fall Meeting)

Improved Modeling of Surface Layer Parameters in a AGCM Using Refined Vertical Resolution in the Surface Layer

Hyeyum Hailey Shin^1,2, Ming Zhao³, Yi Ming⁴, Prof. Xi Chen^3,5 and Shian-Jiann Lin³, (1)UCAR CPAESS, Boulder, CO, United States, (2)NOAA, GFDL, Princeton, NJ, United States, (3)Geophysical Fluid Dynamics Laboratory, Princeton, NJ, United States, (4)Boston College, Department of Earth and Environmental Sciences, Schiller Institute for Integrated Science and Society, Chestnut Hill, United States, (5)Institute of Atmospheric Physics, Chinese Academy of Sciences, Beijing, China

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