Reviewing the electrical properties and its implication of the creeping Chihshang Fault with magnetotelluric and High-Resolution Electrical Resistivity Imaging measurements


Gong-Ruei Ho, Academia Sinica, Institute of Earth Sciences, Taipei, Taiwan and Ping-Yu Chang, Institute of Geophysics National Central University, Taoyuan City, Taiwan
Back to: The Nature of Creeping Faults: Where, Why, and How They Slip Slowly II Posters