Characterizing farm-scale variability in maize yields in West Africa by integrating optical and passive microwave earth observation data with a process model

Fletcher, Sarah

Characterizing farm-scale variability in maize yields in West Africa by integrating optical and passive microwave earth observation data with a process model

Sarah Fletcher, Massachusetts Institute of Technology, Cambridge, MA, United States, Hamed Alemohammad, Radiant Earth Foundation, Washington, DC, United States, Anjuli Jain Figueroa, Stanford University, Stanford, CA, United States and Dara Entekhabi, Massachusetts Institute of Technology, Department of Civil and Environmental Engineering, Cambridge, MA, United States