The advantages of repeating survey lines during FDEM data collection for high resolution subsurface mapping
Daan Hanssens1, Willem Waegeman2, Ellen Van De Vijver1 and Philippe De Smedt1, (1)Ghent University, Department of Environment, Gent, Belgium, (2)Ghent University, Department of Mathematical Modelling, Statistics and Bioinformatics, Ghent, Belgium
