A comparison of bulk- and bin-microphysical schemes for warm rain processes and their polarimetric radar fingerprints : sensitivity analysis and implications for microphysical parameterizations

Prat, Olivier

A comparison of bulk- and bin-microphysical schemes for warm rain processes and their polarimetric radar fingerprints : sensitivity analysis and implications for microphysical parameterizations

Olivier P Prat, North Carolina State University Raleigh, Raleigh, NC, United States, Matthew R Kumjian, Pennsylvania State University Main Campus, University Park, PA, United States, Karly Jackson Reimel, Colorado State University, Department of Atmospheric Science, Fort Collins, CO, United States, Hugh Morrison, NCAR, MMM Laboratory, Boulder, CO, United States and Marcus van Lier-Walqui, Columbia University, Center for Climate Systems Research, New York, NY, United States