Preliminary Program subject to change
10B08 Fault Detection and Diagnosis II
OverviewContributions are sought in the field of process analytical technology (PAT). Both the development of new analytical technologies and their application to process modeling, monitoring, optimization, and control are of interest. All application areas are of interest including pharmaceuticals, semiconductors, nanotechnology, fuel cells, and biotechnology. All analytical technologies are of interest including near-infrared, ATR-FTIR, Raman, in-situ XRD, in-situ particle imaging, and laser-based techniques.
Primary SponsorSystems and Process Control (10b)

Chair

Annette A. Johnston
Devlopment Team Leader
Abbott Laboratories
Dept. 04AR NCR13-2
1401 N. Sheridan Road
North Chicago, IL 60064-6292
Phone Number: 847 935 5120
Fax Number: 847 938 6370
Email: annette.johnston@abbott.com

CoChair

Subbarao Varigonda
Dr.
United Technologies Research Center
Controls & Embedded Systems
411 Silver Lane, MS 129-15
East Hartford, CT 06108
Phone Number: 860-610-7254
Fax Number: 860-660-1435
Email: varigos@utrc.utc.com
Self- Constructing and Organizing Neural Network Based Fuzzy Clustering Technique and Its Application to Fault Diagnosis
Bharat Bhushan and Jose A. Romagnoli, Department of Chemical Engineering, Process System Engineering Group, Building J01, The University of Sydney, NSW, 2006, Sydney, Australia
Fault-Tolerant Control of a Polyethylene Reactor
Adiwinata Gani, Department of Chemical & Biomolecular Engineering, University of California, Los Angeles, 420 Westwood Plaza, Los Angeles, CA 90095, Prashant Mhaskar, University of California, Los Angeles, Department of Chemical Engineering, Los Angeles, CA 90095-1592 and Panagiotis D. Christofides, University of California, Los Angeles, Department of Chemical Engineering, Boelter Hall 5531, Los Angeles, CA 90095-1592
An Intelligent Pca Approach for on-Line Fault Isolation
jun Liu1, K.W. Lim2, R. Srinivasan1 and X.T. Doan1, (1)Institute of Chemical and Engineering Sciences, Singapore, Singapore, (2)Agency for Science, Technology and Research, Singapore, Singapore
Multi-Scale Fisher Discriminant Analysis
Rudramurty Balla, Chemical Engineering, University of South Alabama, Engineering Lab Building EGLB 248, Mobile, AL 36688 and Manish Misra, University of South Alabama, Engineering Lab Building EGLB 248, Mobile, AL 36688
Nonlinear Diagonal Unknown Input Observers for Fault Diagnosis
Pramod Vachhani, GE India Technology Centre Pvt. Ltd, Plot #122, Export Promotion Industrial Park, Whitefield Road, Bangalore, Karnataka 560 066, India, Sridharakumar Narasimhan, Clarkson University, Box 5707, Clarkson University, Potsdam, NY 13699-5707 and Raghunathan Rengaswamy, Chemical Engineering, Clarkson University, Box 5707, Clarkson University, Potsdam, NY 13699-5707
Monitoring and Fault Diagnosis by Multivariate Statistical Methods in Chemical Processes
Ridvan BERBER, Department of Chemical Engineering, Ankara University, Faculty of Engineering, Prof. Aziz Kansu Building, Tandogan Campus, Ankara, 06500, Turkey and Levent AKCAY, Department of Research, Analysis and Statistical Techniques, State Institute of Statistics, Bakanliklar, Ankara, 06100, Turkey
Probabilistic Sensor Fault Detection and Identification in Distributed Parameter Systems
Swa Metta1, Masoud Soroush1, Nasir Mehranbod2, Michael J. Piovoso3 and Babatunde A. Ogunnaike4, (1)Chemical and Biological Engineering, Drexel University, Philadelphia, PA 19104, (2)Chemical Engineering, Shiraz University, Shiraz, Iran, (3)School of Graduate Professional Studies, Penn State University, 30 E. Swedesford Road, Malvern, PA 19355, (4)Chemical Engineering, University of Delaware, 150 Academy Street, Colburn Lab, Newark, DE 19716

Computing and Systems Technology Division