New Emissive Materials for Efficient and Stable Blue Organic Light Emitting Diodes
Samson A. Jenekhe1, Abhishek P. Kulkarni1, Yan Zhu1, Christopher J. Tonzola2 and Angela P. Gifford2, (1)Chemical Engineering, University of Washington, Seattle, WA 98195, (2)Chemistry, University of Washington, Seattle, WA 98195 |
Ultrathin Films by Covalent Molecular Assembly: Polythiophene-Polyimide Composites with Reduced Surface Resistivity
Fengxiang Zhang, National University of Singapore, Blk E5, 4 Engineering Drive 4, Singapore, 117576, Singapore and M. P. Srinivasan, Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, Singapore, Singapore |
Effect of Chemically Modified Dielectric Interfaces on Semiconducting Polymer Chain Orientation
Brandon M. Vogel, Polymers Division, National Institute of Standards and Technology, 100 Bureau Dr., MS 8541, Rm B314, Gaithersburg, MD 20899, Dean M. DeLongchamp, National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8541, Building 224 Room A327, Gaithersburg, MD 20899-8541, Daniel Fischer, National Institute of Standards and Technology, Brookhaven National Laboratories, Upton, NY 11973, Sharadha Sambasivan, National Institute of Standards and Technology, Bldg. 535A Brookhaven National Laboratory, Upton, NY 11973 and Eric K. Lin, National Institute of Standards and Technology, 100 Bureau Dr., Stop 8541, Bldg. 224, Rm. B320, Gaithersburg, MD 20899-8541 |
Measuring Structure and Order Development in Organic Semiconductor Films with Soft X-Ray Spectroscopy
Dean M. DeLongchamp1, Eric K. Lin2, Daniel Fischer3, Sharadha Sambasivan4, Brandon M. Vogel5, J. M. J. Frechet6, Vivek Subramanian7 and Amanda R. Murphy6, (1)National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8541, Building 224 Room A327, Gaithersburg, MD 20899-8541, (2)National Institute of Standards and Technology, 100 Bureau Dr., Stop 8541, Bldg. 224, Rm. B320, Gaithersburg, MD 20899-8541, (3)National Institute of Standards and Technology, Brookhaven National Laboratories, Upton, NY 11973, (4)National Institute of Standards and Technology, Bldg. 535A Brookhaven National Laboratory, Upton, NY 11973, (5)Iowa State University, 100 Bureau Dr., MS 8543, Gaithersburg, MD 20899, (6)Department of Chemistry, University of California, 718 Latimer Hall, Department of Chemistry, Berkeley, CA 94720, (7)Department of Electrical Engineering and Computer Sciences, University of California, 571 Cory Hall, Berkeley, CA 94720-1770 |
Reversible Switching of Conducting Polymer Films between Superhydrophobicity and Superhydrophilicity
Lianbin Xu, Wilfred Chen, Ashok Mulchandani and Yushan Yan, Department of Chemical and Environmental Engineering, University of California, Riverside, CA 92521 |
Segregation, Leaching, and Adsorption of Small Molecules in Polymer Thin Films: Implications for Immersion Lithography
Erin Jablonski1, Wesley Reinhardt1 and Daniel Fischer2, (1)Department of Chemical Engineering, Bucknell University, Lewisburg, PA 17837, (2)NIST, Brookhaven National Laboratories, Upton, NY 11973 |
Plasma Treatment and Surface Analysis of Polyimide Films for an Electroless Copper Build-up Process
Sue Ann Bidstrup Allen, D. Bhusari, Harley Hayden and Paul A. Kohl, Chemical Engineering, Georgia Tech, Atlanta, GA 30332-0100 |
Quantification of the Reaction-Diffusion Front in Photoresist Thin Films
Bryan D. Vogt1, Vivek M. Prabhu1, Shuhui Kang1, Eric K. Lin1, Wen-li Wu1, Sushil K. Satija2 and Karen Turnquest3, (1)Polymers Division, National Institute of Standards and Technology, 100 Bureau Dr Stop 8541, Gaithersburg, MD 20899, (2)Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, (3)International SEMATECH, 2706 Montopolis Dr, Austin, TX 78741 |