Monday, 31 October 2005 - 4:30 PM
136d

Kinetic Monte-Carlo Simulations of Nanowire Growth

Mahendra K. Sunkara1, Ramakrishna Mulpuri2, and Rammohan Ragade2. (1) Chemical engineering, University of Louisville, 106, Ernst Hall, Louisville, KY 40292, (2) Computer engineering Computer Sciences, University of Louisville, 106, Ernst Hall, Louisville, KY 40292

We have modeled nanowire growth using a kinetic Monte-Carlo scheme to understand the following: faceting, growth direction, and the growth kinetics. The main feature of these simulations is the use of a dynamic size constraint, i.e., the diameter of the growth surface is kept constant, compared to previous approaches which use periodic boundary conditions on a fixed surface. This allows our simulations to predict the growth direction depending upon the growth parameters used. The simulations start with a certain area defined by a circle of a pre-chosen diameter on a two-dimensional surface (say a (100) surface). The growth is modeled using adatom adsorption and desorption with a set of rate constants depending upon the neighborhood of the chosen site while incrementing in time. The programs are written in C++ for implementations on UNIX and Windows platforms and are initially intended for diamond cubic materials systems such as Si, Ge and diamond.

The simulation results show a linear relationship for length as time increases (V ~ t), which is expected for 1-D growth under kinetic control. Simulations with a set of rate constants allowing ‘faster' growth led to nanowires with <100> growth directions while slower growth led to nanowires with <111> growth directions. Nanowires grown epitaxially on <100> substrates attain <111> growth directions depending upon the process conditions. In addition, the faceting of nanowires with <100> growth directions indicate four-fold faceting while nanowires with <111> directions yield faceting that varies from triangular to 3-dimensional at their tips.


See more of #136 - Structure-Property Modeling Strategies for Nanostructures (T2008)
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