| Preliminary Program subject to change |
| 10C07 Process Monitoring and Fault Detection |
| The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas:
Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis.
Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions.
Incorporation of process knowledge into fault detection, identification, and diagnosis.
Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications
Data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications. |
| Computers in Operations and Information Processing (10c) |
| Systems and Process Control (10b) |
Chair
Leo H. Chiang
The Dow Chemical Company
Corporate R&D
2301 Brazosport Blvd., B1463
Freeport, TX 77584
U.S.A.
Phone Number: 979-238-5377
Fax Number: 979-238-0100
Email: HChiang@dow.com
CoChair
Jin Wang
Assistant Professor
Department of Chemical Engineering
Auburn University
Auburn, AL 36849
Phone Number: 334-844-2020
Fax Number: 334-844-2063
Email: wang@auburn.edu
|
Fault Detection Using Principal Component Based K-Nearest-Neighbor Rule
Qinghua (Peter) He, Department of Chemical Engineering, Tuskegee University, Tuskegee, AL 36088 |
Multivariate Batch Process Monitoring Utilizing Summary Variables with An Application to Semiconductor Etch
Neal B. Gallagher, Barry M. Wise, Jeremy M. Shaver, Robert T. Roginski and R. Scott Koch, Eigenvector Research, Inc., 160 Gobblers Knob Lane, Manson, WA 98831 |
Batch Polymerization Monitoring Using Mewa and Mpca
Carlos R. Alvarez, Mariano Asteasuain, Adriana Brandolin and Mabel C. Sanchez, Planta Piloto de Ingeniería Química (CONICET - UNS), Camino La Carrindanga km 7, Bahía Blanca, 8000, Argentina |
Multivariate Pattern Matching In Fed-Batch Cell Culture
Jon C. Gunther1, Jeremy S. Conner2, Jeffrey Baclaski2 and Dale E. Seborg1, (1)Department of Chemical Engineering, University of California, Santa Barbara, CA 93106-5080, (2)Amgen, Inc., 1 Amgen Center Dr., Thousand Oaks, CA 91320-1799 |
Wavelet-Genetic Algorithm Based Real-Time Prognosis Of Process Systems
Jeremy Brewer1, Mike Watson2 and Manish Misra1, (1)Department of Chemical Engineering, University of South Alabama, Engineering Lab Building EGLB 248, Mobile, AL 36688, (2)NASA Marshall Space Flight Center, Huntsville, AL 35812 |
Comparative Performance Analysis of Alternative Approaches for Gross Error Detection and Identification
Carlos R. Alvarez, Adriana Brandolin and Mabel C. Sanchez, Planta Piloto de Ingeniería Química (CONICET - UNS), Camino La Carrindanga km 7, Bahía Blanca, 8000, Argentina |
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