We present an analysis of the system Si/SiO2/Electrolyte solution based on numerical solution of transient Maxwell electrodynamics equations. The fluidic channel with Si/SiO2 walls is the considered as a leaky capacitor (see the Figure). Our data show that there is a relationship between the SiO2 layer thickness and the channel length above which the current leaks become significant. Generally longer channels lead to greater current leaks.
While a potential problem, the current leaks could be utilized to modify the field shape in the fluidic nanochannel. For example it is possible to create local minima or maxima in the potential distribution along the channel which could be utilized for controlled analyte transport or focusing and separation.
