Wednesday, November 19, 2008: 8:30 AM
Room 202-A (Pennsylvania Convention Center)
Description:
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
Sponsor:
Computers in Operations and Information Processing
Chair:
CoChair:
9:10 AM
(439c)
Real-Time Kinetic Hard-Modelling for the Optimisation of Reaction Conditions and the Detection of Process Upset in Semi-Batch Reactors
9:30 AM
(439d)
Industrial Implementation of on-Line Multivariate Quality Control (Part III: Relationship to molecular weights)
9:50 AM
(439e)
Dempster-Shafer Fusion for Collaborative Fault Detection and Identification (FDI) with Application to a Distillation Column Case Study
10:10 AM
(439f)
Fault-Detection and Isolation and Fault-Tolerant Control of Nonlinear Process Systems Using Asynchronous Measurements
10:30 AM
(439g)
Fault Tolerant Controller Design for Transport-Reaction Processes Employing Spatial Controllability
See more of this Group/Topical: Computing and Systems Technology Division
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