Tuesday, November 18, 2008: 12:30 PM
Room 202-A (Pennsylvania Convention Center)
Description:
Papers are invited that present new fault detection and isolation theoretical developments as well as applications.
Sponsor:
Systems and Process Control
Chair:
CoChair:
12:50 PM
(285b)
Fault Detection and Identification in Nonlinear Systems Using Generalized Likelihood Ratio Approach
See more of this Group/Topical: Computing and Systems Technology Division
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