Advancing Transmission Electron Microscopy at the NCEM: Prospects for the Detection of Single Light Atoms in Soft and Hard Materials with a TEAM Microscope

Monday, November 9, 2009: 9:10 AM
Belle Meade A/B (Gaylord Opryland Hotel)

Damien Alloyeau, The National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
Christian Kisielowski, The National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA

The National Center for Electron Microscopy (NCEM) is one of the world's foremost centers for electron microscopy and microcharacterization. As a national user facility, NCEM is open to scientists from universities, government and industrial laboratories after critical review of a scientific proposal. NCEM scientists conduct research by applying new techniques to critical materials problems. Here we present the recent developments of two electron optical methods: High-resolution aberration-corrected imaging and phase contrast microscopy using an electrostatic phase plate. These developments aim at maximizing the impact of electron microscopy on the atomic-scale characterization of soft and hard materials.
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