Session: Characterization of Engineered Particles and Nano-Structured Particles (2010 Annual Meeting)

Description:

The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties.

Sponsor:

Particle Production and Characterization

Co-Sponsor(s):

Solids Flow, Handling and Processing (03C)

Chair:

Stephen L. Conway
Principal Engineer
Merck & Co., Inc.
Center for Material Science and Engineering
WP75B-210
West Point, PA 19486
Phone Number: 215 652 6031
Email: stephen_conway@merck.com

Co-Chair:

Daniel Lepek
Assistant Professor
The Cooper Union
Department of Chemical Engineering
New York, NY 10003
Phone Number: 212-353-4379
Email: lepek@cooper.edu

Papers:

212a

Microfluidic Characterization of Sustained Solute Release From Nano-Porous Hierarchical Assemblies
Vinayak Rastogi, National Institute of Standards and Technology; Krassimir Velikov, Unilever; Orlin D. Velev, North Carolina State University

212b

Synthesis and Comparison of Ceria Nanomaterials with Different Shape and Size
Xiao-an Fu, University of Lousiville; Nitzia Cheong Ng, University of Lousiville

212c

Dynamic Deformation in Particle Adhesion
Michelle N. Chaffee-Cipich, Purdue University; Stephen P. Beaudoin, Purdue University

212d

Spatial Arrangements of Organic Positions Due to Thin Film Nanosmearing Under Shear Environment
Kalyana C. Pingali, Rutgers University; Rafael Mendez, Rutgers University; Alberto Cuitino, Rutgers University; Fernando Muzzio, Rutgers University

212e

In-Situ Synthesis of Ordered Nanoparticle Arrays Via Patterned Block Copolymer Nanoreactors with Different Kinds of Reactions
Xihong Zu, Georgia Institute of Technology; Yulin Deng, Georgia Institute of Technology

212f

Model Direct Analysis and Indirect Fourier Transform Analysis of Small Angle Neutron Scattering From Silica Nanoparticles
Nathan D. Hould, University of Delaware

See more of this Group/Topical: Particle Technology Forum

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