Session: Process Monitoring and Fault Detection (2010 Annual Meeting)

Description:

Latest Advances in Process Monitoring and Fault Detection

Sponsor:

Systems and Process Control

Chair:

S. Joe Qin
Fluor Professor of Process Engineering
University of Southern California
Mork Family Department of Chemical Engineering and Materials Science
925 Bloom Walk
Los Angeles, CA 90089-1211
Phone Number: 213-740-0317
Email: sqin@usc.edu

Co-Chair:

Vikas Shukla
Applications Engineer
ExxonMobil Chemical Company
Baytown, TX 77520
Phone Number: 281-834-0494
Email: vikas.shukla@exxonmobil.com

Papers:

615a

An Integrated Fault Diagnosis and Safe-Parking Framework for Fault-Tolerant Control of Nonlinear Process Systems
Miao Du, McMaster University; Prashant Mhaskar, McMaster University

615b

Moving Horizon Estimation: Efficient Methods for Fast Implementations
Rodrigo López-Negrete de la Fuente, Carnegie Mellon University; Sachin C. Patwardhan, Indian Institute of Technology Bombay; Lorenz T. Biegler, Carnegie Mellon University

615c

Model-Based Fault Detection and Fault-Tolerant Control of Process Systems Using Sampled and Delayed Measurements
Yulei Sun, University of California, Davis; Nael H. El-Farra, University of California, Davis

615d

Effect of Soft Sensor Dynamics On Process Monitoring
Mitchell Serpas, Texas A& M University; Juergen Hahn, Texas A& M University

615e

Multivariate Statistical Process Monitoring Based On Statistics Pattern Analysis
Qinghua He, Tuskegee University; Jin Wang, Auburn University

615f

Bayesian Fault Detection and Isolation: Test Results for a Simple Benchmark Problem
Kris Villez, Purdue University; Babji Srinivasan, Texas Tech University; Ulaganathan Nallasivam, Clarkson University; Humberto Garcia, Idaho National Laboratory; Raghunathan Rengaswamy, Texas Tech University; Shankar Narasimhan, Indian Institute of Technology; Craig Rieger, Idaho National Laboratory; Venkat Venkatasubramanian, Purdue University

615g

Branch and Bound Method for Fault Isolation through Missing Variable Analysis
Vinay Kariwala, Nanyang Technological University; Pabara-Ebiere Odiowei, Cranfield University; Yi Cao, Cranfield University; Tao Chen, Nanyang Technological University

See more of this Group/Topical: Computing and Systems Technology Division

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