Session: PAT for Crystallization Development and Manufacturing (2012 Annual Meeting)

Description:

This session welcomes presentations on recent applications of Process Analytical Technologies (PAT) for development and manufacturing of crystallization processes. PAT applications may include various spectroscopy (FTIR, NIR, Raman), particle size and counting techniques (FBRM, PVM), and other on-line or in-line monitoring or sensing techniques. Novel approaches and methodologies to drive crystallization development are of particular interest.

Sponsor:

Crystallization and Evaporation

Co-Sponsor(s):

Process Research and Innovation (12a)

Chair:

Seth Huggins
Amgen
Chemical Process R&D
One Amgen Center Drive
Thousand Oaks, CA 91320
Phone Number: 805-447-3710
Email: shuggins@amgen.com

Co-Chair:

Greg Sukay
Dir Process Development
Amgen
Chemical Process R&D
Email: gsukay@amgen.com

Papers:

Break

300b

Crystallization Kinetics Identification within a Generic Modeling Framework
Kresten Troelstrup Meisler, Technical University of Denmark (DTU); Noor Asma Fazli Abdul Samad, Technical University of Denmark (DTU); Nicolas von Solms, Technical University of Denmark (DTU); Krist V. Gernaey, Technical University of Denmark (DTU); Rafiqul Gani, Technical University of Denmark

300c

Development of an Empirical Framework for Monitoring CSD Using FBRM in Batch Crystallization
Huayu Li, Georgia Institute of Technology; Martha Grover, Georgia Institute of Technology; Yoshiaki Kawajiri, Georgia Institute of Technology; Ronald W. Rousseau, Georgia Institute of Technology

300d

Apply PAT-Enabled Platform to Realize the QbD Control Strategy for Crystallization Processes
George Zhou, Merck & Co., Inc.; Aaron Moment, Merck & Co., Inc.; Shane T. Grosser, Merck & Co., Inc.; Paul Fernandez, Merck & Co., Inc.; Luke Schenck, Merck & Co, Inc.; John Higgins, Merck and Company, Inc.

300e

Feed-Forward Dynamic Control of an API Crystallization Enabled Through PAT
Shane T. Grosser, Merck & Co., Inc.; George Zhou, Merck & Co., Inc.; Paul Fernandez, Merck & Co., Inc.

300f

Theoretical and Numerical Analysis of Critical Seed Loading in Batch Crystallization
Yu-Ti Tseng, National Taiwan University; Jeffrey D. Ward, National Taiwan University

See more of this Group/Topical: Separations Division

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