719 Process Monitoring & Fault Detection

Thursday, November 19, 2020: 8:00 AM - 9:00 AM
Computing and Systems Technology Division (10) (PreRecorded+)

Description:
This session seeks novel contributions in the broad areas of process monitoring, fault detection, isolation, estimation and accommodation in process systems. Both data-driven and model-based approaches are welcome. Applications to industrial processes are encouraged.

Sponsor:
Information Management and Intelligent Systems
Chair:
Ravendra Singh Email: ravendra.singh@rutgers.edu
Co-Chair:
Luis A. Ricardez Sandoval Email: laricard@uwaterloo.ca


(719a) Trend-Based Assessment of Industrial Rotating Equipment Health
Maxwell Toothman, Kira Barton, Birgit Braun, Scott J. Bury, Michael Dessauer, Kaytlin Henderson, James Moyne and Ray Wright


(719b) Dynamic Risk Assessment in Chemical Processes Using Sparse Identification and Deep Learning.
Bhavana Bhadriraju, Faisal Khan and Joseph Sang-Il Kwon


(719c) Process and Controller Performance Monitoring Using Machine Learning Methods
Fahim Abdullah, Zhe Wu and Panagiotis D. Christofides


(719d) Optimal Actions Prescribed By Model-Predictive Safety
Masoud Soroush, Leila Samandari Masooleh, Ulku Oktem, Warren D. Seider and Jeffrey E. Arbogast


(719e) Root Cause Analysis of Process Faults Using Penalized Piecewise Linear Multiple Birth Support Vector Machine (pPWL-MBSVM)
Pallavi Kumari, Qingsheng Wang and Joseph Sang-Il Kwon


(719g) Monitoring the Stress and Oxide Layer Evolution Profile in a Supercritical Pulverized Coal Boiler
Katherine Reynolds, Elijah Hedrick, Benjamin P. Omell, Stephen E. Zitney and Debangsu Bhattacharyya


(719h) Statistics Pattern Analysis Based k-Nearest Neighbors (SPA-kNN) Fault Detection for Pressure Swing Adsorption Processes
Jangwon Lee, Ankur Kumar, Jesus Flores-Cerrillo, Jin Wang and Q. Peter He
See more of this Group/Topical: Computing and Systems Technology Division
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