AFM-Based Aid for Characterizing High Performance Polymeric Membrane Materials

Tuesday, June 12, 2012: 12:00 PM
Pelican I/II (InterContinental New Orleans)
Donald J. Stookey1, Khoren Sahagian2, John R. Klaehn3 and Eric S. Peterson3, (1)Elah Strategies, Chesterfield, MO, (2)Anasys Instruments, Santa Barbara, CA, (3)Chemical Sciences, Idaho National Laboratory, Idaho Falls, ID

The focus of this investigation has been the application of an AFM-based nano-thermal analysis technique that enables direct measurement of thermal properties and the glass transition temperature (Tg) on a nanometer scale in membrane research.  The technique has been variously employed to study material properties of industrial thermoplastics, polymer blends and composites, particularly mapping topography and the interface between dissimilar materials at the nanometer scale capability of the AFM.  Maruf and associates at the MAST Center at University of Colorado introduced the technique to the membrane field in a recently reported study of the degradation of polyamide barrier layer (PBL) of TFC RO membranes due to chlorine attack1.  In contrast, our work investigates the building of physical properties with polymeric cross-linking and high temperature processing of polymeric films or membrane structures on the nanometer scale.  Included among the materials studies are several high performance (HP) glassy polymers.   Such materials are in the categories that have been shown to be good candidates for high temperature membrane gas separations2.

1  Maruf, S.R. et al, “Glass transition behaviors of interfacially polymerized polyamide barrier layers on thin film composite membranes via nano-thermal analysis”, Polymer, 2011, p. 1-7.

2  John R. Klaehn, Christopher J. Orme, Eric S. Peterson, Frederick F. Stewart and Jagoda M. Urban-Klaehn, “High Temperature Gas Separations Using High Performance Polymers”,  in S. Ted Oyama, and Susan M. Stagg-Williams, editors: Membrane Science and Technology, Vol. 14, Amsterdam: The Netherlands, 2011, pp. 295-307.


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