Preliminary Program subject to change
TWA03 Process Analysis Techniques in the Pharmaceutical Industry
OverviewProcess and particle analysis techniques find valuable application in characterizing, monitoring, controlling, and the process development and scale up of pharmaceutical processes. We invite papers that focus on applications of on-line, in-line, and particle analysis/characterization techniques for enhancing the processing of pharmaceutical unit operations. Specifically, papers are sought that focus on innovative approaches to enhancing process understanding, scale-up methodology, and modeling of pharmaceutical processes by using process/particle analysis techniques.
Primary SponsorParticle and Bulk Powder Characterization (TWa)

Chair

Suhas D. Shelukar
Research Fellow
Merck Research Lab
Pharmaceutical R&D
WP78-110, Sumneytown Pike & Broad St.
West Point, PA 19486
Phone Number: (215) 652-2119
Fax Number: (215) 652-2821
Email: suhas_shelukar@merck.com

CoChair

Richard Turton
Chemical Engineering
West Virginia University
453 Engineering Sc. Building, P.O. Box 6102
Morgantown, WV 26506
Phone Number: 3042932111 x 2402
Fax Number: 3042934139
Email: richard.turton@mail.wvu.edu
Measurement and Control of High Shear Granulation by Image Processing
Satoru Watano1, Yoshinobu Sato1, Toshihiro Akachi1, Tomohiro Iwasaki1 and Ichiro Koizumi2, (1)Department of Chemical Engineering, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka, 599-8531, Japan, (2)Development Departmant, Dalton Corporation, 2-2-30, Chuoh, Jyoto-ku, Osaka, 536-0005, Japan
Effect of Process Variables on Fluid Bed Granulation and Coating - in-Line Monitoring of Granule Size and Population
Mario Hubert1, Andrew Birkmire2, Benjamin Smith1, Eric Dycus3 and Kim T. Walter2, (1)Particle Systems Characterization - Process Analytical Technology, METTLER TOLEDO, Redmond, WA 98052, (2)Niro Pharma Systems, Columbia, MD, (3)Particle Systems Characterization, METTLER TOLEDO, Redmond, WA 98052
Investigation of Operating Parameters That Affect Coating Uniformity in Pan Coating Devices
Preetanshu Pandey, Department of Chemical Engineering, West Virginia University, 453 Engineering Science Building, PO Box 6102, Morgantown, WV 26506 and Richard Turton, Chemical Engineering, West Virginia University, 453 Engineering Sc. Building, P.O. Box 6102, Morgantown, WV 26506
Scale up of Anti-Solvent Crystallization Using in-Line Tools
Des O' Grady and Brian Glennon, School of Chemical and Bioprocess Engineering, UCD, Belfield, Dublin, 4, Ireland
Information Content Analysis of near Infrared Spectral Data for in-Line Monitoring of Batch Crystallisation
Solomon B. Abebe, Institute of Particle Science and Engineering, Unversity of Leeds, Leeds LS2 9JT, Leeds, United Kingdom
Determining Particle Size Distribution of Non-Spheres from Chord Length Measurements
Derek Wilkinson, Mingzhong Li and Kumar Patchigolla, Chemical Engineering, Heriot-Watt University, Edinburgh, United Kingdom

Topical W: Fifth World Congress on Particle Technology