Effect of Powder Gas on Low Pressure Plasma Sprayed Yttria Coatings
Dr. Deidre A. Hirschfeld1, Ms. Sharissa Young2, Mr. Erich Muehlberger3, Dr. Aaron C. Hall4, David H. Huskisson5 and Mr. Dmytro V. Barbash6, 1Materials and Metallurgical Engineering, New Mexico Institue of Mining and Technology, 801 Leroy Place, Socorro, NM 87801, 2Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185-1455, 3Sulzer-Metco, Westbury, NY, 4Joining and Coating Department, Sandia National Laboratories, P.O. Box 5800, MS 1130, Albuquerque, NM 87123-1130, 5Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87123, 6University of New Mexico, 209 Farris Engineering Center, Albuquerque, NM 87131-1341

The morphology and chemistry of low pressure plasma sprayed (LPPS) yttria coatings were investigated.  White yttria powder used as the coating source material was 99.99% pure and contained particles from 1 to 5 microns in size. This yttria powder was plasma sprayed onto 3.5 inch diameter, 0.25 inch thick aluminum substrates using Ar-He as the arc gas.  The powder gas was varied from Ar, to air to O2 between samples.  The sample sprayed using Ar as the powder gas used a chamber pressure of 19 torr and resulted in a very dark colored coating. Subsequent samples were sprayed using air and then oxygen as the powder gas, both using a chamber pressure of 30 torr.  The resulting coating colors were medium gray and very light gray, respectively. A duplicate spraying using oxygen as the powder gas was performed to demonstrate repeatability.  Porosity, splat shape, and the presence of amorphous phases were determined using secondary and backscattered electron microscopy imaging and related to processing conditions.  Energy dispersive spectrometry was used to examine the chemistry of the coating and substrate. X-ray photoelectron spectroscopy (XPS) was used to determine the oxide stoichiometery of each of the coatings and was correlated to coating color.

Session 7: Plasma 2

The Preliminary Program for International Thermal Spray Conference And Exposition (ITSC) (May 15-18, 2006)