NON-CRYSTALLINE SAMPLES UNDER HIGH-PRESSURE CONDITIONS: SYNCHROTRON X-RAY TOMOGRAPHIC AND DIFFRACTION STUDIES

Taking advantage of synchrotron x-ray tomographic and diffraction techniques, the P-V curve of non-crystalline samples could be measured under high-pressure conditions. Two ‘simple’ element cases were performed. The procedure of crystallization of amorphous Se upon compression at room temperature, which was studied in diamond anvil cell combined synchrotron x-ray scattering, diffraction and 3D imaging techniques; as well as the melting and solidification procedure of Ga in large volume press at room and high temperature, will be presented to show the capability of revealing structure and dynamics behaviors in P-V-T-t domains using these advanced techniques.