Abstract: Root System Plasticity to Drought Mitigates Grain-Yield Depression in Wheat (Plant and Animal Genome XX Conference (January 14-18, 2012))

Date: Tuesday, January 17, 2012
Time: 5:30 PM

Room: Pacific Salon 4-5

J. Giles Waines University of California, Riverside

Back to: Root Genomics

<< Previous Abstract | Next Abstract

W624 Root System Plasticity to Drought Mitigates Grain-Yield Depression in Wheat