P0882
Developing KASP Markers for Wheat Pest Resistance in the US High Plains

Chor Tee Tan , Texas A&M AgriLife Research, Amarillo, TX
Shuyu Liu , Texas A&M AgriLife Research, Amarillo, TX
Silvano Ocheya , Texas A&M University, College Station, TX
Smit Dhakal , Texas A&M University, College Station, TX
Yan Yang , Texas A&M University, College Station, TX
Jackie C Rudd , Texas A&M AgriLife Research, Amarillo, TX
Qingwu Xue , Texas A&M AgriLife Research, Amarillo, TX
Amir Ibrahim , Soil and Crop Sciences Dep, College Station, TX
Guorong Zhang , Kansas State University, Hays, KS
Xiangyang Xu , USDA-ARS, Wheat, Peanut and Other Field Crops Research, Stillwaters, OK
Guihua Bai , Hard Winter Wheat Genetics Research Unit, USDA-ARS, Manhattan, KS
Ming Chen , Kansas State University, Manhattan, KS
Ravindra Devkota , Texas A&M AgriLife Research, Amarillo, TX
Hangjin Yu , Texas A&M AgriLife Research, Amarillo, TX
Lisa Garza , Texas A&M AgriLife Research, Amarillo, TX
The wheat production in the US High Plains is affected by several pests and diseases. We have developed kompetitive allele specific PCR (KASP) platform high throughput screening for several important traits including resistance genes to Greenbug (GB), Hessain fly (HF), wheat curl mite (WCM) and wheat streak mosaic virus (WSMV). Gb3 and Gb7 have the broadest spectrum resistance to GB. Both were mapped on chromosome 7DL. CmcTAM112 for WCM resistance from Ae. tauschii was mapped and linked flanking SNP markers were validated. Wsm2 for WSMV resistance was fine-mapped on chromosome 3BS, and H32 with HF resistance was mapped onto 3DL. Closely linked high throughput KASP markers were validated for MAS in different populations. Applications of these tightly linked markers allow breeders to increase selection efficiency and accuracy.