Nicholas A. Meier

Graduate Assistant
Virginia Tech
417 Smyth Hall
Ag Quadrangle
Blacksburg, VA
USA 24061
Email: namvf6@vt.edu

Papers:
P0836 Identification of Genes, Quantitative Trait Loci (QTL) and Diagnostic Markers Associated with Specific End-Use Quality Traits in Soft Red Winter (SRW) Wheat