Generation And Field Emission Of Titania Nanotube Arrays Prepared With A Fast Anodization Process Enabled By Use Of A Deep Eutectic Solvent
Chun-Yi Chen, Dept. of Chemical Engineering, National Tsing-Hua University, Hsin-Chu, Taiwan and Shih-Yuan Lu, Department of Chemical Engineering, National Tsing-Hua University, Hsin-Chu, Taiwan |
Molecular Dynamics Simulation Study of the Degradation of Polymer Nanoimages Created by Nanoimprint
Suhua Zhu1, Xiaobo Ji1, Wencong Lu2 and Liuming Yan2, (1)Department of Chemistry, College of Sciences, School of Material Science and Engineering, Shanghai University, 99 Shangda Road, Shanghai, 20044, China, (2)Department of Chemistry, College of Sciences, Shanghai University, 99 Shangda Road, Shanghai, 20044, China |
Fabrication, Characterization, and Electrical Properties of Ceramic Nanofiber Yarns by Electrospinning
A. F. Lotus1, E. A. Evans1, R. D. Ramsier2, D. H. Reneker3 and G. G. Chase1, (1)Department of Chemical and Biomolecular Engineering, The University of Akron, Akron, OH 44325-3906, (2)Department of Physics, The University of Akron, Akron, OH 44325-4001, (3)Department of Polymer Science, The University of Akron, Akron, OH 44325-3909 |
Large-Scale Production Of Insulator Coated Metal Based Sensors
Evagelos K. Athanassiou, Robert N. Grass and Wendelin J. Stark, Chemistry and Applied Biosciences, Swiss Federal Institute of Technology (ETH Zurich), Wolfgang-Pauli-Str. 10, ETH Hönggerberg, Zurich, 8093, Switzerland |
Atomic-Scale Analysis Of Strained Ultra-Thin Fcc Metallic Films: Defect Dynamics And Strain Relaxation Mechanisms
Kedarnath Kolluri, M. Rauf Gungor and Dimitrios Maroudas, Department of Chemical Engineering, University of Massachusetts, Amherst, MA 01003 |
Structural Analysis Of Organic Electronic Columnar Crystals
Steven D. Hudson, Polymers Division, NIST, 100 Bureau Dr., STOP 8542, Gaithersburg, MD 20899, Virgil Percec, Chemistry, U. Pennsylvania, 231 South 34th Street, Philadelphia, PA 19104-6323, Mihai Peterca, U. Pennsylvania, 231 South 34th Street, Philadelphia, PA 19104-6323 and Goran Ungar, U. Sheffield, Mappin Street, Sheffield, United Kingdom |
Multiresolution Image Characterization Of Line Edge Roughness Using Wave Cluster Technique
Rajib Mukherjee1, A. Palazoglu2 and Jose A. Romagnoli1, (1)Chemical Engineering, Louisiana State Univeristy, Cain Department of Chemical Engineering, South Stadium Road, Baton Rouge, LA 70803, (2)Chemical Engineering & Materials Science, UC Davis, One Shields Ave, Davis, CA 95616 |
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