625 Process Monitoring & Fault Detection


Description:
This session seeks novel contributions in the broad areas of process monitoring, fault detection, isolation, estimation and accommodation in process systems. Both data-driven and model-based approaches are welcome. Applications to industrial processes are encouraged.

Sponsor:
Data and Information Systems
Co-Sponsor(s):
Systems and Process Control (10B)


Chair:
Jeevan Maddala
Assistant Professor
West Virginia University
Chemical and Biomedical Engineering
6th Street and Canton
Morgantown, WV
79409
Email: jeevan.maddala@mail.wvu.edu

Co-Chair:
Yuncheng Du
Assistant Professor
Clarkson University
Department of Chemical & Biomolecular Engineering
Potsdam, NY
Phone Number: 315-268-2284
Email: ydu@clarkson.edu


Papers:
625a
Distributed Fault Diagnosis for Networked Nonlinear Uncertain Systems
Hadi Shahnazari, McMaster University; Prashant Mhaskar, McMaster University
625b
A Multi-Sensor Error Detection and Functional Redundancy Algorithm for Dynamic Systems
Jianyuan Feng, Illinois Institute of Technology; Iman Hajizadeh, Illinois Institute of Technology; Sediqeh Samadi, Illinois Institute of Technology; Mert Sevil, Illinois Institute of Technology; Nicole Frantz, Illinois Institute of Technology; Caterina Lazaro, Illinois Institute of Technology; Zacharie Maloney, Illinois Institute of Technology; Xia Yu, Northeastern University; Elizabeth Littlejohn, University of Chicago; Laurie Quinn, University of Illinois at Chicago; Ali Cinar, Illinois Institute of Technology
625c
Model-Based Fault Detection for Nonlinear Process Systems Using Multiparametric Programing for Parameter Estimation
Ernie Che Mid, University College London; Vivek Dua, University College London
625d
Event Detection and Estimation of Its Influence Based on Fuzzy Qualitative Representation of Measurements and Fuzzy Logic Estimator
Sediqeh Samadi, Illinois Institute of Technology; Kamuran Turksoy, Illinois Institute of Technology; Iman Hajizadeh, Illinois Institute of Technology; Jianyuan Feng, Illinois Institute of Technology; Mert Sevil, Illinois Institute of Technology; Ali Cinar, Illinois Institute of Technology
625e
Fault Detection and Diagnosis of Continuous Processes Via Non-Linear Support Vector Machine Based Feature Selection
Melis Onel, Texas A&M Energy Institute, Texas A&M University; Chris A. Kieslich, Georgia Institute of Technology; Yannis A. Guzman, Princeton University; Christodoulos A. Floudas, Texas A&M University; Efstratios N. Pistikopoulos, Texas A&M Energy Institute, Texas A&M University
625f
Optimal Test Design Framework for Model-Based Active Fault Detection and Isolation
Kyle A. Palmer, University of Connecticut; George M. Bollas, University of Connecticut
625g
Verification of Control Systems with Discrete and Continuous Dynamics
Chintan Bhomia, Carnegie Mellon University; Blake C. Rawlings, Carnegie Mellon University; B. Erik Ydstie, Carnegie Mellon University
625h
Multi-Rate Sampled-Data Observer Design for Nonlinear Systems with Multiple Measurement Delays
Chen Ling, Texas A&M University; Costas Kravaris, Texas A&M University
625i
Data Reconciliation with Inequality Constraints Induces Bias: A Cause for Concern?
Kris Villez, Eawag
Abstract Submissions Closed
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